发明名称 POSITION MEASURING METHOD, EXPOSURE METHOD AND SYSTEM THEREOF, DEVICE PRODUCTION METHOD
摘要 <p>Effects by mask-specific characteristics are minimized and an accuracy with which to measure a mark position is improved. A mask mark RM1 is positioned within an observation visual field in an observation system, any one of a plurality of reference marks FMa, FMb is selectively positioned within an observation visual field based on characteristics with respect to a lighting beam of the mask mark RM1, and position information on the mask mark RM1 relative to a reference mark WFM1 is determined based on the observation results.</p>
申请公布号 WO2002049083(P1) 申请公布日期 2002.06.20
申请号 JP2001010781 申请日期 2001.12.10
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