发明名称 Varying conductance out of a process region to control gas flux in an ALD reactor
摘要 A deposition system includes a process chamber for conducting an ALD process to deposit layers on a substrate. In one embodiment, instead of varying the gas flux on a substrate in the chamber by controlling the flow of gas upstream of the process chamber, the gas flux on the substrate is controlled by controlling the conductance between the process chamber and a lower pressure volume outside the process chamber. The flux of the gas on the substrate varies inversely with the chamber conductance, such that the flux of the gas on the substrate increases when the conductance decreases. Various methods of performing an ALD process by controlling the conductance are disclosed as well as various structures for controlling the conductance.
申请公布号 US2002076508(A1) 申请公布日期 2002.06.20
申请号 US20010027592 申请日期 2001.12.19
申请人 CHIANG TONY P.;LEESER KARL F.;BROWN JEFFREY A.;BABCOKE JASON E. 发明人 CHIANG TONY P.;LEESER KARL F.;BROWN JEFFREY A.;BABCOKE JASON E.
分类号 C23C16/02;C23C16/08;C23C16/18;C23C16/34;C23C16/40;C23C16/44;C23C16/448;C23C16/455;C23C16/458;C23C16/515;H01J37/32;H01L21/285;H01L21/768;(IPC1-7):C23C16/00;B05D3/04 主分类号 C23C16/02
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