发明名称 Energy robust field effect transistor
摘要 A field effect transistor (30) has an array of transistors (31) made up of bonding pads (45-47) and sub-arrays of transistors (41-43). The bonding pads (45-47) are distributed between the sub-arrays of transistors (41-43) to reduce the maximum temperature that any portion of the FET (30) is exposed to while the FET (30) is in a conducting state. A similar effect can be appreciated by adjusting the threshold voltage or pinch-off resistance of the transistors in a portion (101) of an array of transistors (95) or by providing transistors with a higher thermal breakdown in the center of the field effect transistor (30).
申请公布号 US2002074574(A1) 申请公布日期 2002.06.20
申请号 US20010002705 申请日期 2001.10.31
申请人 CHUNG YOUNG SIR;BAIRD ROBERT W. 发明人 CHUNG YOUNG SIR;BAIRD ROBERT W.
分类号 H01L27/02;(IPC1-7):H01L31/119;H01L31/113;H01L31/062;H01L29/76 主分类号 H01L27/02
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