发明名称 High capacity and scanning speed system for sample handling and analysis
摘要 Disclosed is an apparatus for examining and inspecting at least one sample in order to determine characteristics of the sample having the a support for receiving a compact disc, the compact disc having deposited on a surface thereof at least one sample, inspection means for effecting a physical change in at least one sample, the inspection means positioned for registration with the surface of the compact disc bearing at least one sample; and a traversal mechanism adapted for reciprocating movement, to move the sample in and out of the path of the inspection means.
申请公布号 US2002074517(A1) 申请公布日期 2002.06.20
申请号 US20000737660 申请日期 2000.12.15
申请人 KRUTCHINSKY ANDREW;CHAIT BRIAN 发明人 KRUTCHINSKY ANDREW;CHAIT BRIAN
分类号 G01N21/25;G01N35/00;G01N35/10;G01Q30/02;(IPC1-7):A61N5/00;G21G5/00 主分类号 G01N21/25
代理机构 代理人
主权项
地址