发明名称 |
High capacity and scanning speed system for sample handling and analysis |
摘要 |
Disclosed is an apparatus for examining and inspecting at least one sample in order to determine characteristics of the sample having the a support for receiving a compact disc, the compact disc having deposited on a surface thereof at least one sample, inspection means for effecting a physical change in at least one sample, the inspection means positioned for registration with the surface of the compact disc bearing at least one sample; and a traversal mechanism adapted for reciprocating movement, to move the sample in and out of the path of the inspection means.
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申请公布号 |
US2002074517(A1) |
申请公布日期 |
2002.06.20 |
申请号 |
US20000737660 |
申请日期 |
2000.12.15 |
申请人 |
KRUTCHINSKY ANDREW;CHAIT BRIAN |
发明人 |
KRUTCHINSKY ANDREW;CHAIT BRIAN |
分类号 |
G01N21/25;G01N35/00;G01N35/10;G01Q30/02;(IPC1-7):A61N5/00;G21G5/00 |
主分类号 |
G01N21/25 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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