发明名称 PROCESSING METHOD AND PROCESSING APPARATUS
摘要 After a thin film is deposited on a treatment surface of a wafer and the wafer is transferred out of a treatment chamber, a contact projection of a clamp is brought into contact with a susceptor to heat the clamp. Next, a wafer is disposed on the susceptor by elevating the clamp when the wafer, on which a thin film is not deposited, is transferred in. Thereafter, the clamp is brought into contact with the wafer and the wafer is stabilized to a predetermined temperature. Thereafter, a thin film is deposited on a treatment surface of the wafer.
申请公布号 WO0249098(A1) 申请公布日期 2002.06.20
申请号 WO2001JP10959 申请日期 2001.12.14
申请人 TOKYO ELECTRON LIMITED;KOJIMA, YASUHIKO;ARIMA, SUSUMU;YAMASAKI, HIDEAKI;KAWANO, YUMIKO 发明人 KOJIMA, YASUHIKO;ARIMA, SUSUMU;YAMASAKI, HIDEAKI;KAWANO, YUMIKO
分类号 C23C14/50;C23C16/458;C23C16/46;H01L21/00;H01L21/205;H01L21/68;H01L21/683;H01L21/687;(IPC1-7):H01L21/68 主分类号 C23C14/50
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