发明名称 Methodology for control of short channel effects in MOS transistors
摘要 A method of improving short channel effects in a transistor. First, a substance is implanted in a substrate. The substrate is then annealed such that the implanted substance forms at least one void in the substrate. Then, a transistor having a source, a drain, and a channel region is formed on the substrate, wherein the at least one void is in the channel region of the transistor.
申请公布号 US2002074598(A1) 申请公布日期 2002.06.20
申请号 US20010045376 申请日期 2001.11.09
申请人 DOYLE BRIAN S.;ROBERDS BRIAN 发明人 DOYLE BRIAN S.;ROBERDS BRIAN
分类号 H01L21/265;(IPC1-7):H01L29/76;H01L31/113;H01L27/12 主分类号 H01L21/265
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