发明名称 |
METHOD FOR OPTIMIZING CLEANING PROCESS OF CVD APPARATUS |
摘要 |
PURPOSE: A method for optimizing a cleaning process of a CVD(Chemical Vapor Deposition) method is provided to optimize the cleaning process by using a gas such as ClF3 or NF3. CONSTITUTION: A semiconductor wafer is loaded in a quartz tube. The first cleaning process is performed and evaluated by supplying a cleaning gas into the quartz tube with a constant pressure and a constant temperature. A pure quartz sample is loaded in the quartz tube. The second cleaning process is performed and evaluated by supplying the cleaning gas into the quartz tube with the constant pressure and the constant temperature. An optimum condition for the cleaning process is determined according to the first evaluation process and the second evaluation process. The semiconductor wafer is loaded in the quartz tube. An ending point of the cleaning process is determined under the optimum cleaning condition.
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申请公布号 |
KR20020044909(A) |
申请公布日期 |
2002.06.19 |
申请号 |
KR20000074166 |
申请日期 |
2000.12.07 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
CHOI, BAEK SUN;KIM, DONG IL;LEE, SEON U;SEO, HO GEUN |
分类号 |
H01L21/205;(IPC1-7):H01L21/205 |
主分类号 |
H01L21/205 |
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