发明名称 |
METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE HAVING SIMPLIFIED MANUFACTURING PROCESSES |
摘要 |
PURPOSE: A method for manufacturing a semiconductor device having simplified manufacturing processes is provided to minimize an operation deviation and to improve a through-put through skips of peripheral processes by one-step photolithography so as to form a bit line poly-contact(DC) and a storage poly-contact(BC). CONSTITUTION: An interlayer dielectric(20), a nitride(22) as an etch stopper, and an oxide(24) are sequentially deposited on a substrate(10) having a plurality of transistors. One-step photolithography and an etching processes are performed to form a bit line poly-contact(DC) and a storage poly-contact(BC) holes using a reticle having the bit line poly-contact(DC) and the storage poly-contact(BC) pattern as a mask. After depositing a polysilicon(30) in the holes, a metal silicide layer(31) as a bit line and a nitride(32) as a hard mask are sequentially deposited and patterned so as to form the bit line poly-contact plug(33) and the storage poly-contact plug(35).
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申请公布号 |
KR20020044701(A) |
申请公布日期 |
2002.06.19 |
申请号 |
KR20000073705 |
申请日期 |
2000.12.06 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
LEE, YEONG CHEOL;LIM, GA SUN |
分类号 |
H01L27/108;(IPC1-7):H01L27/108 |
主分类号 |
H01L27/108 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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