发明名称 METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE HAVING SIMPLIFIED MANUFACTURING PROCESSES
摘要 PURPOSE: A method for manufacturing a semiconductor device having simplified manufacturing processes is provided to minimize an operation deviation and to improve a through-put through skips of peripheral processes by one-step photolithography so as to form a bit line poly-contact(DC) and a storage poly-contact(BC). CONSTITUTION: An interlayer dielectric(20), a nitride(22) as an etch stopper, and an oxide(24) are sequentially deposited on a substrate(10) having a plurality of transistors. One-step photolithography and an etching processes are performed to form a bit line poly-contact(DC) and a storage poly-contact(BC) holes using a reticle having the bit line poly-contact(DC) and the storage poly-contact(BC) pattern as a mask. After depositing a polysilicon(30) in the holes, a metal silicide layer(31) as a bit line and a nitride(32) as a hard mask are sequentially deposited and patterned so as to form the bit line poly-contact plug(33) and the storage poly-contact plug(35).
申请公布号 KR20020044701(A) 申请公布日期 2002.06.19
申请号 KR20000073705 申请日期 2000.12.06
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 LEE, YEONG CHEOL;LIM, GA SUN
分类号 H01L27/108;(IPC1-7):H01L27/108 主分类号 H01L27/108
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