发明名称 Method for manufacturing cylindrical storage electrode of semiconductor device
摘要 A method for manufacturing a cylindrical storage electrode of a semiconductor device includes forming a contact pad to be connected to an active region of a semiconductor substrate in an interlayer insulator film on the semiconductor substrate. Then, a silicon nitride layer as an etching stop layer is formed on the contact pad. Next, an insulating layer is formed on the silicon nitride layer. A portion of the surface of the silicon nitride layer is exposed by partially removing the insulating layer. Then, the exposed portion of the silicon nitride layer is removed using a wet etching process using a predetermined etchant to expose the surface of the contact pad. A conductive layer for a storage electrode is formed on the insulating layer and the surface of the exposed contact pad. Finally, a cylindrical storage electrode is completed by removing the upper portion of the conductive layer for a storage electrode, the insulating layer and the silicon nitride layer.
申请公布号 US6406967(B1) 申请公布日期 2002.06.18
申请号 US20000632583 申请日期 2000.08.07
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 CHUNG DAE-HYUK;SONG CHANG-LYONG
分类号 H01L21/02;H01L21/8242;H01L27/108;(IPC1-7):H01L21/20 主分类号 H01L21/02
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