发明名称 Test piece analyzing apparatus having a test piece transfer assembly
摘要 A test piece analyzing apparatus is provided which includes a releasably fixed absorbent member, a horizontally reciprocative pinching mechanism for simultaneously transferring a plurality of test pieces in a transfer direction, and an optical analyzing assembly provided with a primary illuminator and a secondary illuminator. The second illuminator serves to illuminate the bottom surface of the test piece.
申请公布号 US6407403(B1) 申请公布日期 2002.06.18
申请号 US20010845579 申请日期 2001.04.30
申请人 KYOTO DAIICHI KAGAKU CO., LTD. 发明人 MURAKAMI ATSUSHI
分类号 G01N1/28;G01N35/00;(IPC1-7):G01N21/86 主分类号 G01N1/28
代理机构 代理人
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