发明名称 Nonvolatile semiconductor memory device
摘要 To read data stored on a memory cell transistor with a floating gate, a flash memory uses: a single-gate reference transistor; a differential sense amplifier; and a gate voltage generator for generating a gate voltage for the reference transistor. The gate voltage generator includes: a dummy cell transistor, which has the same structure as the memory cell transistor and has been turned ON; a current mirror for creating a current proportional to a drain current of the dummy cell transistor; an NMOS transistor for generating a gate voltage for the reference transistor in accordance with the current created by the current mirror; and a voltage hold circuit for holding the gate voltage generated. Even if temperature or fabricating process conditions have changed, this construction ensures accurate and high-speed read operation.
申请公布号 US6407946(B2) 申请公布日期 2002.06.18
申请号 US20000731005 申请日期 2000.12.07
申请人 MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD. 发明人 MARUYAMA TAKAFUMI;KOJIMA MAKOTO
分类号 G11C16/28;(IPC1-7):G11C16/06 主分类号 G11C16/28
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