发明名称 BALL GRIP ARRAY CHIP PACKAGES HAVING IMPROVED TESTING AND STACKING CHARACTERISTICS
摘要 A stackable ball grid array (BGA) or fine ball grid array (FBGA) semiconductor package particularly suitable for board-on-chip or chip-on-board applications in which a low profile BGA or FBGA semiconductor package is needed. The stackable ball grid array (BGA) or fine ball grid array (FBGA) provides a semiconductor package that is capable of being burned in and tested in a more efficient and cost effective manner than prior known BGA or FBGA semiconductor packages. A high density, low profile memory module incorporating a plurality of the disclosed BGA or FBGA semiconductor packages in a stacked arrangement is further disclosed.
申请公布号 SG89395(A1) 申请公布日期 2002.06.18
申请号 SG20010002802 申请日期 2001.05.11
申请人 MICRON TECHNOLOGY, INC. 发明人 WUU YEAN TAY;JEFFREY TOH TUCK FOOK
分类号 G01R1/04;H01L23/31;H01L25/10;H05K1/18 主分类号 G01R1/04
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