发明名称 PHOTOSENSITIVE RESIN COMPOSITION AND METHOD FOR MANUFACTURING PATTERN
摘要 PROBLEM TO BE SOLVED: To provide a photosensitive resin composition from which a film of uniform thickness even to the edge of a wafer can be formed so as to solve such a problem that products are hardly obtained in the corner of a wafer because of the buildup of films on the wafer edge, and to provide a method for manufacturing a pattern by using the above composition. SOLUTION: The photosensitive resin composition contains (a) polymers having the repeating unit expressed by general formula (1) and having monovalent organic groups containing at least one acryloyl group or methacryloyl group and (b) a silicone surfactant consisting of side chain-modified copolymers having Si-C couplings. In formula (1), R1 is a trivalent or tetravalent organic group, R2 is a bivalent organic group, M is a hydrogen atom or monovalent organic group containing acryloyl groups or methacryloyl groups, and n is 1 or 2.
申请公布号 JP2002169280(A) 申请公布日期 2002.06.14
申请号 JP20000364143 申请日期 2000.11.30
申请人 HITACHI CHEMICAL DUPONT MICROSYSTEMS LTD 发明人 KAWASAKI MASARU
分类号 G03F7/027;C08F2/44;C08F2/46;C08F299/02;C08L79/08;G03F7/004;H01L21/312 主分类号 G03F7/027
代理机构 代理人
主权项
地址