CIRCUIT FOR MEASURING CURRENT

摘要

PROBLEM TO BE SOLVED: To measure a measured micro-current in a current measuring circuit, as its main feature. SOLUTION: A gate voltage control circuit 60 is inserted, for example, between an abnormality detecting circuit 50 for detecting generation of abnormality, and a gate of an NMOS transistor M1 for blocking a current path led to a cell in the generation the abnormality. Under a stand-by condition of a mobile equipment, a gate voltage of the transistor M1 is changed with the lapse of time by a sweep circuit 61 inside the control circuit 60 to increase ON-resistance of the transistor M1. A stand-by current flowing between a source-a drain of the transistor M1 is put out as a voltage value in timing bringing preset ON-resistance.