| 发明名称 |
PROBE FOR SCANNING TUNNELING MICROSCOPE AND METHOD OF FABRICATION |
| 摘要 |
PROBLEM TO BE SOLVED: To provide a new probe for a scanning tunneling microscope and a method of fabrication having high conductivity and high optical transmission, and capable of obtaining high plasmon luminous efficiency. SOLUTION: An optical fiber probe is coated with a lamination of an ITO thin film and a metal thin film.
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| 申请公布号 |
JP2002168757(A) |
申请公布日期 |
2002.06.14 |
| 申请号 |
JP20000361807 |
申请日期 |
2000.11.28 |
| 申请人 |
NATIONAL INSTITUTE FOR MATERIALS SCIENCE |
发明人 |
FUJITA DAISUKE;ISHIGE KEIKO |
| 分类号 |
G01B7/34;G01Q60/12;G01Q60/16;(IPC1-7):G01N13/12;G12B21/04 |
主分类号 |
G01B7/34 |
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