| 摘要 |
PROBLEM TO BE SOLVED: To reduce test time. SOLUTION: If a semiconductor chip CP1 is judged as a failure in a test process A (ST12A), the power supply 13 of the semiconductor chip CP1 is destroyed (ST16A, ST17A). Hereby, the semiconductor chip CP1 is judged as a failure in test processes B-D (step ST12B, ST12C, ST12D). Also when the semiconductor chip CP1 is judged as a failure-in test processes B-D (ST12B, ST12C, ST12D), subsequent test processes (ST13B, ST14B, ST13C, ST14C, ST13D, ST14D) for the semiconductor chip CP1 are not carried out and the test processes B-D for the semiconductor chip CP1 are terminated. Hereby, in the test processes B-D, it is possible to reduce the test time by the time (tb, tc, td) required for the subsequent test items to be tested after the failure judgment.
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