发明名称 |
PHOTOMASK BLANK AND METHOD OF MANUFACTURING PHOTOMASK BLANK |
摘要 |
<p>PROBLEM TO BE SOLVED: To provide a method of manufacturing a photomask blank which lessens the warpage of a substrate by film stress (relieves the film stress) and improves the density and denseness of the films. SOLUTION: The method of manufacturing the photomask blank by forming the light shielding films or light translucent films on a transparent substrate comprises forming the light shielding films or light translucent films by depositing the light shielding films or light translucent films by a sputtering method on the substrate 6 and simultaneously irradiating the film materials under deposition on the substrate 6 with the ions formed by an ion former (hereafter an ion source 11) separately included in a deposition chamber.</p> |
申请公布号 |
JP2002169265(A) |
申请公布日期 |
2002.06.14 |
申请号 |
JP20000367837 |
申请日期 |
2000.12.01 |
申请人 |
HOYA CORP |
发明人 |
KUREISHI MITSUHIRO;NOZAWA JUN |
分类号 |
C23C14/00;C23C14/34;C23C14/48;G03F1/50;G03F1/54;H01L21/027;(IPC1-7):G03F1/08 |
主分类号 |
C23C14/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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