发明名称 CERAMIC HEATER FOR MANUFACTURING AND INSPECTING SEMICONDUCTOR
摘要 <p>PROBLEM TO BE SOLVED: To provide a ceramic heater for manufacturing and inspecting semiconductor which can protect a wafer from thermal shocks by reducing the unevenness in temperature in the periphery of a through hole, such as an inserting hole, vacuum suction hole, etc., is improved in the controllability of temperature control units, such as a thermocouple, temperature fuse, etc., and can uniformly cure a resin. SOLUTION: A heating element 14 is provided on or in a ceramic substrate 12. In addition, the corner sections of the inserting holes 16, recessed section 18, vacuum suction hole 20, etc., of the substrate 12 are formed in chamfered shapes.</p>
申请公布号 JP2002170753(A) 申请公布日期 2002.06.14
申请号 JP20010227295 申请日期 2001.07.27
申请人 IBIDEN CO LTD 发明人 ITO YASUTAKA
分类号 H05B3/20;H01L21/02;H01L21/66;H01L21/68;H01L21/683;(IPC1-7):H01L21/02 主分类号 H05B3/20
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