发明名称 APPARATUS AND METHOD FOR MEASURING NOISE FACTOR
摘要 PROBLEM TO BE SOLVED: To provide an apparatus and a method for measuring noise factor, in which the level of ASE light outputted from an optical amplifier can be measured accurately and easily. SOLUTION: A spectrum P2(λ) of the output light from an optical amplifier or a spectrum P1(λ) of the input signal light are formed, the difference between the P2(λ) and P1(λ) multiplied by a temporary gain GT is determined (step S232), the spectrum data thus obtained is subjected to noise-removing processing, e.g. moving mean processing, and spline interpolation processing, to form the spectrum P3(λ) data of ASE light, and then the level of the ASE light PASE is determined (steps S233-S235). A noise factor measuring apparatus 10 calculates the number of channels of WDM light or the signal light wavelength of each channel from the P1(λ) or P2(λ), and carries out an analysis for calculating the noise factor NF in a prescribed wavelength range centered about each calculated wavelength.
申请公布号 JP2002168691(A) 申请公布日期 2002.06.14
申请号 JP20000361527 申请日期 2000.11.28
申请人 ANDO ELECTRIC CO LTD 发明人 ISHIHARA GENTARO;MORI TORU
分类号 G01J3/02;G01J3/28;H01S3/00;H04B10/08;(IPC1-7):G01J3/02 主分类号 G01J3/02
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