| 摘要 |
PROBLEM TO BE SOLVED: To provide a semiconductor circuit for a test capable of mounting a large number of monitors without being limited by the number of pads. SOLUTION: This semiconductor circuit includes serially connected circuits connected in series by connection of fellow terminals with plural test circuits of which the each contains the monitor of a measured object and has two terminals, a terminal for supplying a voltage from an outside to one end of the serially connected circuits, a terminal for connecting the other end of the serially connected circuits to an external ground, a measuring terminal capable of measuring a potential from an outside, and a selector means for selecting the optional test circuit to connect at least one of two terminals of the selected test circuits to the measuring terminal.
|
