| 摘要 |
PROBLEM TO BE SOLVED: To enable detection for diffraction X rays as well appearing in a higher angle region as in the measurement of the stress of a sample in the X-ray diffraction apparatus using a curved PSPC(Position Sensitive Proportional Counter). SOLUTION: The curved PSPC 20 is arranged to be so positioned that a virtual plane containing a circular arc-like core line 22 built therein 20 shifts parallel from the optical axis O of X rays R made to irradiate a sample S through a collimator 10. This enables the arranging of one end 22a of the core line 22 built in the curved PSPC 20 at a position that allows the detection of diffraction X rays generated from the sample to a higher angle region extending to 180 deg. in the angle of diffraction.
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