| 摘要 |
<p>The present invention relates to a system and method for scanning electronically acquired periodic images from an object and thereafter, inspecting the periodic images by using predetermined rules. The method to inspect the image includes an algorithm for analyzing the periodic patterns of the image and detecting deviations from numerical acceptance norms. In the system, the field of view of a camera, such as a video camera, viewing the object includes a two-dimensional image of the object. The camera captures the two-dimensional image of the object and converts the image into an array of scan lines, whereby each scan line represents a one-dimensional 'slice' of target shape of the object. Hence, while all two dimensional images do not have periodic pattern, the array of scan lines represents a periodic pattern that is used by the algorithm in the inventive system.</p> |
