发明名称 |
Method for unpatterned resist etch back of shallow trench isolation refill insulator |
摘要 |
A method for forming shallow trench isolation structures is provided that includes forming a plurality of isolation trenches (32) in a substrate (10) where the isolation trenches (32) separate active areas (18). An insulation layer (44) is formed outwardly from the substrate (10) with the insulation layer (44) filling the isolation trenches (32) and covering the active areas (18). A planarization layer (46) is formed outwardly from the insulation layer (44). The planarization layer (46) and the insulation layer (44) are removed together at a substantially even rate down to a polish stop (14) outward from the active areas (18).
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申请公布号 |
US2002072237(A1) |
申请公布日期 |
2002.06.13 |
申请号 |
US20000732468 |
申请日期 |
2000.12.07 |
申请人 |
BOWLES CHRISTOPHER MARK;ASHBURN STANTON PETREE;SHINN GREGORY BOYD;CRISWELL DANIEL S. |
发明人 |
BOWLES CHRISTOPHER MARK;ASHBURN STANTON PETREE;SHINN GREGORY BOYD;CRISWELL DANIEL S. |
分类号 |
H01L21/302;H01L21/3105;H01L21/461;H01L21/762;(IPC1-7):H01L21/302 |
主分类号 |
H01L21/302 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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