发明名称 Method of manufacturing semiconductor device
摘要 Obtained is a method of manufacturing a semiconductor device which can take a body contact while electrically isolating an NMOS transistor and a PMOS transistor from each other through a complete isolation. First of all, element isolating films (7a to 7c) of a partial isolation type are formed in a first main surface of a silicon layer (3). Next, a PMOS transistor, an NMOS transistor, a multilayer wiring structure, a spiral inductor (20) and a pad (22) are formed, respectively. Then, a support substrate (23) is formed over the whole surface. Thereafter, a silicon substrate (1) and a BOX layer (2) are removed to expose a second main surface of the silicon layer (3). Subsequently, element isolating films (27a to 27d) connected to the element isolating films (7a and 7b) are formed on the second main surface side of the silicon layer (3). Consequently, a complete isolation can be obtained.
申请公布号 US2002072161(A1) 申请公布日期 2002.06.13
申请号 US20020073337 申请日期 2002.02.13
申请人 MITSUBISHI DENKI KABUSHIKI KAISHA 发明人 MAEDA SHIGENOBU
分类号 H01L21/76;H01L21/762;H01L21/84;(IPC1-7):H01L21/336 主分类号 H01L21/76
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