发明名称 Embedded gettering layer in shallow trench isolation structure
摘要 The invention includes a shallow trench isolation structure having a trench formed in the Si substrate and having an upper surface, a liner layer formed in the trench overlying the upper surface of the trench, a gettering material layer formed on the liner layer; and a filler oxide formed on the gettering material layer The gettering material layer inhibits the diffusion of metallic contaminants from the filler oxide into the surrounding silicon substrate regions
申请公布号 US2002070421(A1) 申请公布日期 2002.06.13
申请号 US20020071921 申请日期 2002.02.08
申请人 ASHBURN STANTON PETREE;EKLUND ROBERT HOWARD 发明人 ASHBURN STANTON PETREE;EKLUND ROBERT HOWARD
分类号 H01L21/762;H01L23/26;(IPC1-7):H01L21/76;H01L29/00 主分类号 H01L21/762
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