发明名称 |
Embedded gettering layer in shallow trench isolation structure |
摘要 |
The invention includes a shallow trench isolation structure having a trench formed in the Si substrate and having an upper surface, a liner layer formed in the trench overlying the upper surface of the trench, a gettering material layer formed on the liner layer; and a filler oxide formed on the gettering material layer The gettering material layer inhibits the diffusion of metallic contaminants from the filler oxide into the surrounding silicon substrate regions
|
申请公布号 |
US2002070421(A1) |
申请公布日期 |
2002.06.13 |
申请号 |
US20020071921 |
申请日期 |
2002.02.08 |
申请人 |
ASHBURN STANTON PETREE;EKLUND ROBERT HOWARD |
发明人 |
ASHBURN STANTON PETREE;EKLUND ROBERT HOWARD |
分类号 |
H01L21/762;H01L23/26;(IPC1-7):H01L21/76;H01L29/00 |
主分类号 |
H01L21/762 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|