发明名称 Methods for deuterium sintering
摘要 A method for deuterium sintering to improve the hot carrier aging of an integrated circuit includes (a) providing a partially fabricated integrated circuit structure comprising a semiconductor substrate and a dielectric layer formed on at least a portion of the substrate, the dielectric layer having at least one conductive material via plug formed therein and (b) sintering the structure in the presence of a gas comprising deuterium-containing components at high temperatures prior to a metallization layer being deposited on the structure.
申请公布号 US2002072187(A1) 申请公布日期 2002.06.13
申请号 US20000733570 申请日期 2000.12.08
申请人 CHETLUR SUNDAR SRINIVASAN;ROY PRADIP KUMAR;PATEL MINESH AMRAT;SEN SIDHARTHA;SAXENA VIVEK 发明人 CHETLUR SUNDAR SRINIVASAN;ROY PRADIP KUMAR;PATEL MINESH AMRAT;SEN SIDHARTHA;SAXENA VIVEK
分类号 H01L21/28;H01L21/30;H01L21/324;H01L21/768;(IPC1-7):H01L21/336;H01L21/44;H01L21/26;H01L21/42;H01L21/477 主分类号 H01L21/28
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