发明名称 |
Test method of electro-optical device, test circuit of electro-optical device, electro-optical device, and electronic equipment |
摘要 |
The invention performs an accurate testing in order to determine the presence or absence of a defect in a wiring and electrodes in an electro-optical device. A test method is provided for testing an electro-optical device that includes a capacitor arranged at an intersection of each scanning line and each data line. A test switching element connected between the data line and a reading signal-line is turned on after storing a charge responsive to a data signal in the capacitor so that the voltage responsive to the charge stored in the capacitor is output to the reading signal-line. The timing of switching on the test switching element is set to be different from the timing of a level change of a test clock pulse that defines the operation of a test circuit.
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申请公布号 |
US2002070750(A1) |
申请公布日期 |
2002.06.13 |
申请号 |
US20010994675 |
申请日期 |
2001.11.28 |
申请人 |
SEIKO EPSON CORPORATION |
发明人 |
FUJITA SHIN |
分类号 |
G01R31/02;G02F1/13;G02F1/133;G02F1/1345;G09G3/00;G09G3/20;G09G3/34;G09G3/36;(IPC1-7):G01R31/00 |
主分类号 |
G01R31/02 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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