发明名称 Dynamic testing of electronic assemblies
摘要 Method and apparatus for providing dynamic testing of electronic assemblies during their manufacture. A production line includes a communication network to interconnect assembly and inspection equipment. Events impacting the manufacture of the assemblies are communicated among the equipment, allowing the testing to be dynamically adjusted in response to events. Dynamic adjustment allows the process to quickly detect defects introduced by events. The concept is illustrated with a production line that has a pick and place machine and an inspection station. When an operator changes a reel of components at the pick and place machine, the inspection station will switch test programs to quickly verify that the correct reel has been loaded.
申请公布号 US2002072822(A1) 申请公布日期 2002.06.13
申请号 US20010850241 申请日期 2001.05.07
申请人 RAYMOND DOUGLAS W.;SALDANA NELSON R.;WOOD JOHN F. 发明人 RAYMOND DOUGLAS W.;SALDANA NELSON R.;WOOD JOHN F.
分类号 G01R31/28;G06F19/00;(IPC1-7):G06F19/00 主分类号 G01R31/28
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