| 摘要 |
A method of testing a semiconductor device begins by reading test information into a testing apparatus. The test information is used to determine whether to perform a normal test or a fuzzy test depending on fuzzy conditions. The order of test items included in the normal test can be changed based on defect rates. And the test items to be included in the fuzzy test can be determined by selecting one or more test items from among the normal test items. The fuzzy conditions can be satisfied if the number of consecutive products that have passed the test is greater than a first value or the number of consecutive products that have failed the test is less than a second value. The test can be automatically switched between the normal test and the fuzzy test, thereby minimizing the time taken to test a semiconductor device. Also, the order of the test items can be changed so that the test begins with the test item having the highest defect rate and ends with the test item having the lowest defect rate, thereby reducing reject time. In this manner, test efficiency can be enhanced and testing expenses can be reduced.
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