发明名称 |
Apparatus for testing shaped surfaces by employing eddy currents |
摘要 |
<p>Eddy current inspection of a contoured surface (14) of a workpiece (12) is performed by forming a backing piece (18) of flexible, resiliently yieldable material with a contoured exterior surface (26) conforming in shape to the workpiece contoured surface (14). The backing piece is preferably cast in place so as to conform to the workpiece contoured surface. A flexible eddy current array probe (20) is attached to the contoured exterior surface (26) of the backing piece (18) such that the probe (20) faces the contoured surface (14) of the workpiece (12) to be inspected when the backing piece (18) is disposed adjacent to the workpiece (12). The backing piece (18) is then expanded volumetrically by inserting at least one shim (32) into a slot (28) in the backing piece (18) to provide sufficient contact pressure between the probe (20) and the workpiece contoured surface (14) to enable the inspection of the workpiece contoured surface to be performed. <IMAGE></p> |
申请公布号 |
CZ20013437(A3) |
申请公布日期 |
2002.06.12 |
申请号 |
CZ20010003437 |
申请日期 |
2001.09.25 |
申请人 |
GENERAL ELECTRIC COMPANY |
发明人 |
BARZINGER THOMAS JAMES;FULTON JAMES PAUL;ROSE CURTIS WAYNE;PEROCCHI LEE CRANFORD |
分类号 |
F01D5/30;F01D25/00;F02C7/00;G01N27/20;G01N27/90;(IPC1-7):G01N27/20 |
主分类号 |
F01D5/30 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|