发明名称 |
METHOD FOR FABRICATING CAPACITOR |
摘要 |
PURPOSE: A method for fabricating a capacitor is provided to prevent a diffusion barrier layer from being oxidized by oxygen diffusion in a dielectric layer deposition process and a subsequent heat treatment process, by performing a NH3 plasma process regarding oxygen remaining in a metal thin film for a lower electrode in a dielectric layer deposition chamber by an in-situ method. CONSTITUTION: The diffusion barrier layer is formed on a semiconductor substrate(21). A lower electrode is formed on the diffusion barrier layer. The semiconductor substrate having the lower electrode is transferred to a dielectric layer reaction chamber. A plasma treatment process is performed regarding the lower electrode in the dielectric layer reaction chamber. A dielectric layer is formed on the plasma-processed lower electrode in the dielectric layer reaction chamber. An upper electrode(30) is formed on the dielectric layer.
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申请公布号 |
KR20020043913(A) |
申请公布日期 |
2002.06.12 |
申请号 |
KR20000073112 |
申请日期 |
2000.12.04 |
申请人 |
HYNIX SEMICONDUCTOR INC. |
发明人 |
KIM, GYEONG MIN;SONG, HAN SANG |
分类号 |
H01L27/108;(IPC1-7):H01L27/108 |
主分类号 |
H01L27/108 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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