发明名称 METHOD FOR FABRICATING CAPACITOR
摘要 PURPOSE: A method for fabricating a capacitor is provided to prevent a diffusion barrier layer from being oxidized by oxygen diffusion in a dielectric layer deposition process and a subsequent heat treatment process, by performing a NH3 plasma process regarding oxygen remaining in a metal thin film for a lower electrode in a dielectric layer deposition chamber by an in-situ method. CONSTITUTION: The diffusion barrier layer is formed on a semiconductor substrate(21). A lower electrode is formed on the diffusion barrier layer. The semiconductor substrate having the lower electrode is transferred to a dielectric layer reaction chamber. A plasma treatment process is performed regarding the lower electrode in the dielectric layer reaction chamber. A dielectric layer is formed on the plasma-processed lower electrode in the dielectric layer reaction chamber. An upper electrode(30) is formed on the dielectric layer.
申请公布号 KR20020043913(A) 申请公布日期 2002.06.12
申请号 KR20000073112 申请日期 2000.12.04
申请人 HYNIX SEMICONDUCTOR INC. 发明人 KIM, GYEONG MIN;SONG, HAN SANG
分类号 H01L27/108;(IPC1-7):H01L27/108 主分类号 H01L27/108
代理机构 代理人
主权项
地址