APPARATUS FOR PREVENTING SCATTERED REFLECTION OF BEAM FOR MEASURING DEFECTS ON BACK SURFACE OF STRIP

摘要

PURPOSE: An apparatus for preventing scattered reflection of a beam for measuring defects on the back surface of a strip is provided to accurately measure surface defects formed on the lower part of the surface of the strip by improving detection capability of the surface defects and preventing contamination of measuring units. CONSTITUTION: The apparatus for preventing scattered reflection of a beam for measuring defects on the back surface of a strip comprises a foreign material shutoff means shutting off foreign materials dropped onto measuring units(3,4) of a surface defect detector; a control means determining an ejection angle based on thickness, width and speed of a hot rolled strip(12) during the transferring of the hot rolled strip, controlling the determined ejection angle, ejection pressure and suction pressure, and controlling opening and closing of the foreign material shutoff means; an open and shut means controlling opening or shutting of the foreign material shutoff means according to the control means; an angle adjusting means(14) adjusting the ejection angle according to controlling of the control means; an air amount control means(9) controlling an air amount supplied from an air supply tank according to controlling of the control means; an air ejection means(6) including a plural nozzles which is installed on the upper part of one side of the foreign material shutoff means to eject a dried air onto the upper surface of the foreign material shutoff means through the air amount control means(9); and a suction means(7) which is installed on the upper part of the other side of the foreign material shutoff means to suck in foreign materials on the foreign material shutoff means according to controlling of the control means.