发明名称 Lithography apparatus with filters for optimizing uniformity of an image
摘要 A lithographic projection apparatus has a correction device for lithographic projection. The lithographic projection apparatus has a projection system that projects a beam of radiation onto a mask. The correction device has a filter unit placed in the path of the beam for varying the spatial intensity of the beam along at least one direction of its cross-section so that the integrated intensity of radiation of mask level is substantially uniform across the entire length or the cross-section.
申请公布号 US6404499(B1) 申请公布日期 2002.06.11
申请号 US19990293000 申请日期 1999.04.16
申请人 ASML NETHERLANDS B.V. 发明人 STOELDRAIJER JUDOCUS M. D.;TEN CATE JAN W. R.;FEY FRANCISCUS H. A. G.;SYTSMA JOOST
分类号 H01L21/027;G03F7/20;G03F7/23;(IPC1-7):G01B11/00 主分类号 H01L21/027
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