发明名称 Bases and surfactants and their use in photoresist compositions for microlithography
摘要 A photoresist composition having: (A) a polymer selected from the group consisting of: (a) a fluorine-containing copolymer having a repeat unit derived from at least one ethylenically unsaturated compound characterized in that at least one ethylenically unsaturated compound is polycyclic; (b) a branched polymer containing protected acid groups, said polymer comprising one or more branch segment(s) chemically linked along a linear backbone segment; (c) fluoropolymers having at least one fluoroalcohol group having the structure: -C(R<SUB>f</SUB>)(R<SUB>f</SUB>')OH, wherein R<SUB>f </SUB>and R<SUB>f</SUB>' are the same or different fluoroalkyl groups of from 1 to about 10 carbon atoms or taken together are (CF<SUB>2</SUB>)<SUB>n </SUB>wherein n is 2 to 10; (d) amorphous vinyl homopolymers of perfluoro(2,2-dimethyl-1,3-dioxole) or CX<SUB>2</SUB>-CY<SUB>2 </SUB>where X-F or CF<SUB>3 </SUB>and Y--H or amorphous vinyl copolymers of perfluoro(2,2-dimethyl-1,3-dioxole) and CX<SUB>2</SUB>-CY<SUB>2</SUB>; and (e) nitrile/fluoroalcohol-containing polymers prepared from substituted or unsubstituted vinyl ethers; (B) at least one photoactive component; and (C) a functional compound selected from the group consisting of a base and a surfactant. The polymer may have an absorption coefficient of less than about 5.0<SUP>m?-1 </SUP>at a wavelength of about 157 nm. These photoresist compositions have improved imaging properties.
申请公布号 AU2865502(A) 申请公布日期 2002.06.11
申请号 AU20020028655 申请日期 2001.11.26
申请人 E.I. DU PONT DE NEMOURS AND COMPANY 发明人 LARRY L. BERGER;MICHAEL CARL CRAWFORD;FRANK L. SCHADT III;FREDRICK CLAUS ZUMSTEG JR.
分类号 G03F7/00;G03F7/004;G03F7/038;G03F7/039;G03F7/20;G03F7/30;H01L21/027 主分类号 G03F7/00
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