发明名称 |
Process for manufacturing MOS transistors having elevated source and drain regions and a high-k gate dielectric |
摘要 |
A method of manufacturing an integrated circuit utilizes solid phase epitaxy to form an elevated source region and an elevated drain region. The method includes providing an amorphous semiconductor material and crystallizing the amorphous semiconductor material without damaging a high-k gate dielectric layer. The semiconductor material can be silicided. A shallow source drain implant can also be provide.
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申请公布号 |
US6403434(B1) |
申请公布日期 |
2002.06.11 |
申请号 |
US20010779987 |
申请日期 |
2001.02.09 |
申请人 |
ADVANCED MICRO DEVICES, INC. |
发明人 |
YU BIN |
分类号 |
H01L21/28;H01L21/285;H01L29/51;H01L29/78;(IPC1-7):H01L21/336 |
主分类号 |
H01L21/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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