发明名称 Double gate transistor having a silicon/germanium channel region
摘要 A method of manufacturing an integrated circuit with a channel region containing germanium. The method includes providing an amorphous semiconductor material including germanium, crystallizing the amorphous semiconductor material, and doping to form a source location and a drain location. The semiconductor material containing germanium can increase the charge mobility associated with the transistor. A double gate structure can also be formed.
申请公布号 US6403981(B1) 申请公布日期 2002.06.11
申请号 US20000633209 申请日期 2000.08.07
申请人 ADVANCED MICRO DEVICES, INC. 发明人 YU BIN
分类号 H01L21/336;H01L21/337;H01L29/786;H01L29/80;(IPC1-7):H01L29/04;H01L31/20;H01L31/036;H01L31/037 主分类号 H01L21/336
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