| 摘要 |
The invention relates to method for determining the existence of contaminations in a material, which method comprises: providing a relatively small partial quantity of said material as a sample quantity, and detecting the existence of any defects in said sample quantity. The method is characterized in that it comprises detecting defects of a first size and at least a second size, determining a relationship of the number of detected defects as a function of the size of the defects, and determining the sizes of a number of defects which is so large that the distribution of detected defects in said sample quantity provides information regarding the existence of defects of additional sizes in said material. The invention also relates to a device for determining the existence of contaminations in a material. By means of the invention, an accurate and efficient assessment of the quality of a material, e.g. a polymer material, is provided. <IMAGE> |
