发明名称 TRANSFER ROBOT AND INSPECTION METHOD FOR THIN SUBSTRATE
摘要 <p>A transfer robot (5) for thin substrate capable of efficiently detecting the stored state of thin substrates and an inspection method for thin substrate capable of accurately detecting the stored state of thin substrates; the robot (5), comprising an inspection camera (1) for detecting the stored state of the thin substrates (3) in a storage cassette (2), wherein the plurality of thin substrates (3) stored in the storage cassette (2) are carried out from the storage cassette (2) by the robot.</p>
申请公布号 WO0245154(A1) 申请公布日期 2002.06.06
申请号 WO2001JP10293 申请日期 2001.11.26
申请人 KABUSHIKI KAISHA YASKAWA DENKI;WAKIZAKO, HITOSHI;SHIRAISHI, KAZUNARI;SAGASAKI, YUKITO;MOTONAGA, KEN-ICHI;HINO, KAZUNORI;SANEMASA, HIROKI 发明人 WAKIZAKO, HITOSHI;SHIRAISHI, KAZUNARI;SAGASAKI, YUKITO;MOTONAGA, KEN-ICHI;HINO, KAZUNORI;SANEMASA, HIROKI
分类号 B25J13/08;B25J9/04;B25J18/04;B25J19/02;B25J19/04;B65G49/06;B65G49/07;H01L21/00;H01L21/677;H01L21/68;(IPC1-7):H01L21/68 主分类号 B25J13/08
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