发明名称 CONDUCTIVE LAYER FILLED TRENCH ISOLATION SEMICONDUCTOR DEVICE AND FORMATION METHOD THEREOF
摘要 PURPOSE: A conductive layer filled trench isolation semiconductor device and a formation method thereof are provided to improve an operating speed and the efficiency by reducing an inverse narrow width effect. CONSTITUTION: A trench isolation semiconductor device comprises an upper part having a silicon nitride(33) and a silicon oxide(35), a side part made of a silicon nitride oxidation layer(20), and a conductive layer(31) made of a dopant doped polysilicon connected to a substrate(10) at the bottom part of the conductive layer(31) and surrounded with the silicon nitride(33) and the silicon nitride oxidation layer(20). At this time, active regions(13) having a source and a drain region are completely isolated by connecting the conductive layer(31) and the substrate(10), thereby preventing an inverse narrow width effect, so that the property can be improved.
申请公布号 KR20020042275(A) 申请公布日期 2002.06.05
申请号 KR20000072091 申请日期 2000.11.30
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 LEE, JAE GYU;LEE, SANG HYEON
分类号 H01L21/76;H01L21/74;H01L21/762;H01L21/763;H01L21/8242;H01L27/108;(IPC1-7):H01L21/76 主分类号 H01L21/76
代理机构 代理人
主权项
地址