发明名称 CMOS IMAGE SENSOR HAVING DEFECT INFORMATION IN SAME CHIP
摘要 PURPOSE: A CMOS(Complementary Metal Oxide Semiconductor) image sensor is provided to reduce manufacture costs by recording a position information of a defect pixel in the sensor itself without an extra-chip. CONSTITUTION: A CMOS(Complementary Metal Oxide Semiconductor) image sensor roughly comprises a pixel signal transformation unit(10) connected with each pixel, a fuse array unit(12) connected to the pixel signal transformation unit(10), a power supplier(16) providing power to the pixel signal transformation unit(10) through a logic gate, and a CI sensor input/output unit(14) outputting a digital signal provided from the pixel signal transformation unit(10) and inputting a defined control signal. Due to the composition of the CMOS image sensor, a defect pixel position is informed to an image signal processor(200) so as to recover the damaged data before operating the CMOS image sensor.
申请公布号 KR20020042001(A) 申请公布日期 2002.06.05
申请号 KR20000071684 申请日期 2000.11.29
申请人 C.I.SENSOR CO., LTD. 发明人 CHO, MYEONG GIL
分类号 H01L27/146;(IPC1-7):H01L27/146 主分类号 H01L27/146
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