发明名称 Semiconductor device fabrication system
摘要 A semiconductor device fabrication system for carrying out a UV-bake on a photoresist pattern in the semiconductor device pattern formation, includes a photoresist coating unit coating a wafer with a specific photoresist; a developing unit forming a photoresist pattern on the wafer coated with the photoresist; and a cross-linking and flow baking unit for cross-linking the photoresist pattern and subsequently flow baking the cross-linked photoresist pattern, wherein the cross-linking and flow baking unit thermally stabilizes the photoresist pattern prior to flow baking.
申请公布号 US6398430(B1) 申请公布日期 2002.06.04
申请号 US20000634999 申请日期 2000.08.08
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 JEOUNG GYU-CHAN;CHOI KWANG-SEOK;JUNG JIN-HANG;KIM YOUNG-SUN;LEE HONG;CHUNG HOE-SIK;LEE SUNG-HO;HA HUN-HWAN
分类号 G03F7/20;G03F7/40;H01L21/308;(IPC1-7):G03D5/00 主分类号 G03F7/20
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