发明名称 X-ray fluorescence analyzer
摘要 An X-ray fluorescence analyzer utilizing principles of an X-ray fluorescence method comprising X-ray generation means 1 for generation of X-rays, a shutter 2 for shielding against X-ray beam irradiation, generated by the X-ray generation means, to a sample to be measured, X-ray detection means 4 for detecting secondary X-rays, generated as the result of X-ray beam irradiation, to a sample to be measured, measurement control instruction means 5 for instructing to start and to stop measurement, operation delay means 6 for outputting a signal to shutter actuating means 3 after a fixed period of time has elapsed after the measurement start instruction signal from the measurement control instruction means 5 is input, and display means 7 for displaying that the X-ray fluorescence analyzer is performing measurement during the period when from the measurement start instruction signal is input from the measurement control instruction means 5 until the measurement stop instruction signal is input.
申请公布号 US6400795(B2) 申请公布日期 2002.06.04
申请号 US20010910107 申请日期 2001.07.20
申请人 SEIKO INSTRUMENTS INC. 发明人 YAGI SHIGEKI
分类号 G01N23/223;(IPC1-7):G01N23/223 主分类号 G01N23/223
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