发明名称 Method of forming monocrystalline silicon layer, method for manufacturing semiconductor device, and semiconductor device
摘要 Single-crystal silicon is deposited on an insulating substrate (1) with a crystalline sapphire layer (50) formed thereon as a seed, to form a silicon epitaxial layer (7). P-type impurity ions are implanted into a single-crystal silicon layer, and then N-type impurity ions are implanted to make a P-channel MOS transistor portion a single-crystal silicon layer (14). In a single-crystal silicon layer (11), an N+ source region (20) and drain region (21) of an N-channel MOS transistor are formed. Thus, a silicon layer is epitaxially grown uniformly at low temperatures.
申请公布号 US6399429(B1) 申请公布日期 2002.06.04
申请号 US20000486619 申请日期 2000.02.29
申请人 SONY CORPORATION 发明人 YAMOTO HISAYOSHI;YAMANAKA HIDEO;SATOU YUICHI;YAGI HAJIME
分类号 C30B25/02;H01L21/20;H01L21/205;H01L21/336;H01L21/762;H01L21/77;H01L21/84;H01L21/86;H01L29/786;(IPC1-7):H01L21/00 主分类号 C30B25/02
代理机构 代理人
主权项
地址