| 摘要 |
An examining structure for a circuit protective element comprises a plurality of conductive plates 3 of a conductive circuit 2 which is formed in a pattern on a circuit board 1, a pair of lead terminals 8 provided in the circuit protective element and respectively connected to the conductive plates 3, a test probe 4 for supplying a large current to the lead terminals 8 in order to examine a normal operation of the circuit protective element, and a test pad 6 soldered to the conductive plate 3 which is connected to the lead terminal, the test pad being adapted to be in contact with the test probe, thereby to constitute a probe contact part 5 having a thickness larger than the conductive plate. The test pad is smaller in size than the surface of the conductive plate and positioned near the lead terminal. The test pad is composed of a plurality of contact members having the same shape so as to keep a contact area with the test probe uniformly. The contact members are arranged uniformly. The contact members are solders arranged on one face of the conductive plate and directly attached to and projecting from the conductive plate. The solders may be formed at an opening of a through hole formed in the conductive plate by filling it in the opening.
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