发明名称 ALIGNER, ALIGNING METHOD AND METHOD FOR FABRICATING DEVICE
摘要 In an aligner (100), a detection light flux from an irradiation system (20a) is reflected off the surface and rear of a light transmitting protective member for protecting the pattern face of a mask (R), first and second reflected light beams thus produced are received by a light receiving system (20b), and a main controller (50) calculates the thickness of the protective member based on the detection signals. Exposure is enabled where variation in the focus state of the pattern image is taken into account depending on the calculated thickness of the protective member. Irrespective of difference in the thickness of the protective member for protecting the pattern face of a mask, highly accurate exposure can be effected. Setting of detection offset of the light receiving system or resetting of the origin is eliminated by optimizing the incident angle of the detection light flux.
申请公布号 WO0243123(A1) 申请公布日期 2002.05.30
申请号 WO2001JP10184 申请日期 2001.11.21
申请人 NIKON CORPORATION;SHIRAISHI, NAOMASA 发明人 SHIRAISHI, NAOMASA
分类号 G03F7/20;G03F9/00;(IPC1-7):H01L21/027 主分类号 G03F7/20
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