发明名称 METHOD FOR ETCHING SEMICONDUCTOR DEVICES USING NEUTRAL-BEAM AND ETCHER USING THE SAME
摘要 PURPOSE: An etching method of semiconductor devices is provided to easily perform an etch processing on a semiconductor device without a physical or an electrical damage by using neutral-beam gotten from a simple method. CONSTITUTION: An ion beam having a constant polarity is firstly extracted and accelerated from an ion source(10). The ion beam is secondly transformed to a neutral-beam by reflecting the accelerated ion beam to a reflection part(18) made of a semiconductor substrate, a silicon dioxide, or a metal substrate. At this time, the transformation of the ion beam to the neutral-beam is carried out by controlling an incidence angle of the ion beam. After locating a substrate(20) on the progressing route of the neutral-beam, a specific material layer of the substrate(20) is lastly etched by the neutral-beam.
申请公布号 KR20020039840(A) 申请公布日期 2002.05.30
申请号 KR20000069660 申请日期 2000.11.22
申请人 YEOM, GEUN YOUNG 发明人 LEE, DO HAENG;YEOM, GEUN YOUNG
分类号 H01L21/306;C23F1/00;H01J37/305;H01J37/317;H01L21/00;H01L21/302;H01S1/00;(IPC1-7):H01L21/306 主分类号 H01L21/306
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