发明名称 |
METHOD FOR ETCHING SEMICONDUCTOR DEVICES USING NEUTRAL-BEAM AND ETCHER USING THE SAME |
摘要 |
PURPOSE: An etching method of semiconductor devices is provided to easily perform an etch processing on a semiconductor device without a physical or an electrical damage by using neutral-beam gotten from a simple method. CONSTITUTION: An ion beam having a constant polarity is firstly extracted and accelerated from an ion source(10). The ion beam is secondly transformed to a neutral-beam by reflecting the accelerated ion beam to a reflection part(18) made of a semiconductor substrate, a silicon dioxide, or a metal substrate. At this time, the transformation of the ion beam to the neutral-beam is carried out by controlling an incidence angle of the ion beam. After locating a substrate(20) on the progressing route of the neutral-beam, a specific material layer of the substrate(20) is lastly etched by the neutral-beam.
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申请公布号 |
KR20020039840(A) |
申请公布日期 |
2002.05.30 |
申请号 |
KR20000069660 |
申请日期 |
2000.11.22 |
申请人 |
YEOM, GEUN YOUNG |
发明人 |
LEE, DO HAENG;YEOM, GEUN YOUNG |
分类号 |
H01L21/306;C23F1/00;H01J37/305;H01J37/317;H01L21/00;H01L21/302;H01S1/00;(IPC1-7):H01L21/306 |
主分类号 |
H01L21/306 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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