发明名称 |
SLURRY FOR CHEMICAL-MECHANICAL POLISHING |
摘要 |
PURPOSE: To inhibit dishing and erosion generated in the chemical-mechanical polishing(CMP) of a copper-based metal film, when an embedded wiring of the copper-based metal film is formed on a barrier metal film of a tantalum- based metal. CONSTITUTION: This slurry for polishing is used for carrying out chemical- mechanical polishing(CMP). In this case, the slurry for polishing contains at least a polishing abrasive, an oxidizer, and a basic amino acid. |
申请公布号 |
KR20020040637(A) |
申请公布日期 |
2002.05.30 |
申请号 |
KR20010073321 |
申请日期 |
2001.11.23 |
申请人 |
NEC CORPORATION;TOKYO MAGNETIC PRINTING CO., LTD. |
发明人 |
AOYAGI KENICHI;ITAKURA TETSUYUKI;SAKURAI SHIN;TSUCHIYA YASUAKI;WAKE TOMOKO |
分类号 |
B24B37/00;C09G1/02;C09K3/14;C09K13/00;C23F3/00;H01L21/304;H01L21/321;(IPC1-7):C09K13/00 |
主分类号 |
B24B37/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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