发明名称 SLURRY FOR CHEMICAL-MECHANICAL POLISHING
摘要 PURPOSE: To inhibit dishing and erosion generated in the chemical-mechanical polishing(CMP) of a copper-based metal film, when an embedded wiring of the copper-based metal film is formed on a barrier metal film of a tantalum- based metal. CONSTITUTION: This slurry for polishing is used for carrying out chemical- mechanical polishing(CMP). In this case, the slurry for polishing contains at least a polishing abrasive, an oxidizer, and a basic amino acid.
申请公布号 KR20020040637(A) 申请公布日期 2002.05.30
申请号 KR20010073321 申请日期 2001.11.23
申请人 NEC CORPORATION;TOKYO MAGNETIC PRINTING CO., LTD. 发明人 AOYAGI KENICHI;ITAKURA TETSUYUKI;SAKURAI SHIN;TSUCHIYA YASUAKI;WAKE TOMOKO
分类号 B24B37/00;C09G1/02;C09K3/14;C09K13/00;C23F3/00;H01L21/304;H01L21/321;(IPC1-7):C09K13/00 主分类号 B24B37/00
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