发明名称 Method for preparing semiconductor including formation of contact hole using difluoromethane gas
摘要 A method for forming a contact hole in a semiconductor device includes the steps of forming a polymer layer on an upper portion and a side wall of photo resist mask, while etching an oxide layer under the photoresist mask to form a contact hole that uses an etchant gas comprising CH2F2 gas; and etching the oxide layer while stopping the supply of CH2F2 gas to the etching process.
申请公布号 US2002064945(A1) 申请公布日期 2002.05.30
申请号 US20010995747 申请日期 2001.11.29
申请人 CHOI SUNG-GIL;AHN TAE-HYUK 发明人 CHOI SUNG-GIL;AHN TAE-HYUK
分类号 H01L21/28;H01L21/302;H01L21/3065;H01L21/311;H01L21/4763;H01L21/768;(IPC1-7):H01L21/476 主分类号 H01L21/28
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