发明名称 HIGH TEMPERATURE ELECTRODE AND BARRIER STRUCTURE FOR FRAM AND DRAM
摘要 PURPOSE: A semiconductor structure is provided to be capable of enduring an annealing at a high temperature without damaging conductivity and perfection. CONSTITUTION: The semiconductor structure includes a substrate selected among substrates of a group of silicon, polysilicon, silicon dioxide, and silicon germanium, and an electrode located on the substrate. The electrode contains a layer of a composition of Ir-M-O. Where, M is a metal selected from one among metals of a group of Ta, Ti, Nb, Al, Hf, Zr, and V. The semiconductor structure is constructed and arranged so as to endure the annealing at a temperature of 600°C or more without damaging conductivity and perfection.
申请公布号 KR20020040559(A) 申请公布日期 2002.05.30
申请号 KR20010071075 申请日期 2001.11.15
申请人 SHARP CORPORATION 发明人 HSU SHENG TENG;YING HONG;ZHANG FENGYAN
分类号 H01L21/28;H01L21/02;H01L21/283;H01L21/3205;H01L21/8242;H01L21/8246;H01L27/10;H01L27/105;H01L27/108;H01L29/49;(IPC1-7):H01L21/283 主分类号 H01L21/28
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