摘要 |
Production of spacer oxide layers on the side walls of field effect transistors comprises forming control electrodes (5c, 5d, 5e) made from polysilicon on a semiconductor substrate (1), each electrode separated from the substrate by a gate oxide (4c, 4d, 4e); implanting ions into the side walls of the electrodes to increase the oxidation rate of the polysilicon; and thermally oxidizing the implanted electrodes at a defined temperature to form spacer oxide layers. Preferred Features: The ions are implanted into the electrodes at an angle ( alpha ) with respect to the side walls. The electrodes have a defined height (H) and distance (A) from each other. The implanting ions are fluorine and/or argon.
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