发明名称 Production of spacer oxide layers on the side walls of field effect transistors comprises forming control electrodes made from polysilicon on a substrate, implanting ions into the side walls of the electrodes
摘要 Production of spacer oxide layers on the side walls of field effect transistors comprises forming control electrodes (5c, 5d, 5e) made from polysilicon on a semiconductor substrate (1), each electrode separated from the substrate by a gate oxide (4c, 4d, 4e); implanting ions into the side walls of the electrodes to increase the oxidation rate of the polysilicon; and thermally oxidizing the implanted electrodes at a defined temperature to form spacer oxide layers. Preferred Features: The ions are implanted into the electrodes at an angle ( alpha ) with respect to the side walls. The electrodes have a defined height (H) and distance (A) from each other. The implanting ions are fluorine and/or argon.
申请公布号 DE10062494(A1) 申请公布日期 2002.05.29
申请号 DE20001062494 申请日期 2000.12.15
申请人 INFINEON TECHNOLOGIES AG 发明人 CURELLO, GIUSEPPE
分类号 H01L21/265;H01L21/8238;H01L21/8242;(IPC1-7):H01L21/336;H01L21/823 主分类号 H01L21/265
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